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Estimation of sample spacing in stochastic processes

By Anders Rønn-Nielsen, Jon Sporring and Eva B. Vedel Jensen
CSGB Research Reports
No. 17, December 2016

Motivated by applications in electron microscopy, we study the situation where a stationary and isotropic random field is observed on two parallel planes with unknown distance. We propose an estimator for this distance. Under the tractable, yet flexible class of Léevy-based random field models, we derive an approximate variance of the estimator. The estimator and the approximate variance perform well in two simulation studies.

Keywords: Léevy-based modelling, Monte Carlo methods, random fields, stereology, section distance, systematic sampling, variance, variogram.

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